comBinatorial bIg daTa Test dAta Generator (BIT-TAG)
Published on Jan 06, 2017 | By Haider Riaz Khan | Permalink
Nan Li, Jeff Lei, Haider Riaz Khan, J Liu, Yun Guo. Applying Combinatorial Test Data Generation to Big Data Applications. ASE 2016: Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering.